LPCVD TIN AS BARRIER LAYER IN VLSI

被引:50
作者
YOKOYAMA, N
HINODE, K
HOMMA, Y
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D O I
10.1149/1.2096764
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:882 / 883
页数:2
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[2]   GROWTH AND PROPERTIES OF TIN AND TIOXNY DIFFUSION-BARRIERS IN SILICON ON SAPPHIRE INTEGRATED-CIRCUITS [J].
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THIN SOLID FILMS, 1987, 153 :287-301