THE INFLUENCE OF ALKALI ATOMS IMPLANTED IN SILICON ON THE NEGATIVE SECONDARY ION EMISSION

被引:2
|
作者
FRENTRUP, W
GRIEPENTROG, M
KLOSE, H
KREYSCH, G
MULLERJAHREIS, U
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1984年 / 84卷 / 01期
关键词
D O I
10.1002/pssa.2210840134
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:269 / 272
页数:4
相关论文
共 50 条
  • [21] INVESTIGATION OF SECONDARY ION-ION EMISSION FROM SILICON
    DEREBAS, IA
    LYSENKO, SA
    MATULEVICH, YT
    PROMOKHOV, AA
    IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1994, 58 (04): : 158 - 164
  • [23] LASER-INDUCED RE-EMISSION OF SILICON ATOMS IMPLANTED INTO QUARTZ
    SHIMIZU, T
    ITOH, N
    MATSUNAMI, N
    JOURNAL OF APPLIED PHYSICS, 1988, 64 (07) : 3663 - 3666
  • [24] Study of the Influence of Implanted Atoms on the Coefficients of the Sputtering of Silicon and Silicon with a Thin Oxide Film
    Tashmukhamedova, D. A.
    Yusupjanova, M. B.
    Tashatov, A. K.
    Umirzakov, B. E.
    JOURNAL OF SURFACE INVESTIGATION, 2018, 12 (05): : 902 - 905
  • [25] Influence of simultaneously implanted As+ ions on diffusivity and activation efficiency of B atoms implanted into silicon
    Yokota, Katsuhiro
    Nakamura, Takafumi
    Miyashita, Fumiyoshi
    Hirai, Kiyoto
    Takano, Hiromichi
    Kumagai, Masao
    Ando, Yasuo
    Matsuda, Kouji
    1637, Trans Tech Publ, Zurich, Switzerland (196-201):
  • [26] Influence of simultaneously implanted As+ ions on diffusivity and activation efficiency of B atoms implanted into silicon
    Yokota, K
    Nakamura, T
    Miyashita, F
    Hirai, K
    Takano, H
    Kumagai, M
    Ando, Y
    Matsuda, K
    ICDS-18 - PROCEEDINGS OF THE 18TH INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS, PTS 1-4, 1995, 196- : 1637 - 1641
  • [27] NEGATIVE SECONDARY ION EMISSION FROM OXIDIZED SURFACES
    GNASER, H
    SURFACE SCIENCE, 1984, 138 (2-3) : 561 - 569
  • [28] ANALYSIS OF SUBMONOLAYERS ON SILVER BY NEGATIVE SECONDARY ION EMISSION
    BENNINGHOVEN, A
    PHYSICA STATUS SOLIDI, 1969, 34 (02): : K169 - +
  • [29] NEGATIVE ENERGY IONS IN SECONDARY-ION EMISSION
    DOROZHKIN, AA
    KOVARSKII, AP
    LIFATU, AV
    PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1992, 18 (19): : 86 - 90
  • [30] Lateral spreads of ion-implanted Al and P atoms in silicon carbide
    Jin, Qimin
    Nakajima, Masashi
    Kaneko, Mitsuaki
    Kimoto, Tsunenobu
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2021, 60 (05)