MEASUREMENT OF DIELECTRIC PROPERTIES OF LOW-LOSS MATERIALS

被引：14
|
作者：
LYNCH, AC
机构：
来源：
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON | 1965年 / 112卷 / 02期
关键词：
D O I：
10.1049/piee.1965.0067
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：426 / &
相关论文
共 50 条
  • [1] Measurement of Dielectric Properties for Low-Loss Materials at Millimeter Wavelengths
    Jones, Charles R.
    Dutta, Jo
    Yu, Guofen
    Gao, Yuanci
    JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES, 2011, 32 (06) : 838 - 847
  • [2] Measurement of Dielectric Properties for Low-Loss Materials at Millimeter Wavelengths
    Charles R. Jones
    Jo Dutta
    Guofen Yu
    Yuanci Gao
    Journal of Infrared, Millimeter, and Terahertz Waves, 2011, 32 : 838 - 847
  • [3] Low-loss dielectric ceramic materials and their properties
    Sebastian, M. T.
    Ubic, R.
    Jantunen, H.
    INTERNATIONAL MATERIALS REVIEWS, 2015, 60 (07) : 392 - 412
  • [4] MICROWAVE MEASUREMENT OF DIELECTRIC PROPERTIES OF LOW-LOSS MATERIALS BY THE DIELECTRIC ROD RESONATOR METHOD.
    Kobayashi, Yoshio
    Katoh, Masayuki
    1600, (MTT-33):
  • [5] Measurement of low-loss dielectric materials using dielectric rod resonator
    Wang, Li-Qiang
    Zheng, Hong-Xing
    Feng, Li-Ying
    Gao, Feng-You
    INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES, 2008, 29 (01): : 63 - 68
  • [6] MICROWAVE MEASUREMENT OF DIELECTRIC-PROPERTIES OF LOW-LOSS MATERIALS BY THE DIELECTRIC ROD RESONATOR METHOD
    KOBAYASHI, Y
    KATOH, M
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1985, 33 (07) : 586 - 592
  • [7] Measurement of Low-Loss Dielectric Materials Using Dielectric Rod Resonator
    Li-Qiang Wang
    Hong-Xing Zheng
    Li-Ying Feng
    Feng-You Gao
    International Journal of Infrared and Millimeter Waves, 2008, 29 : 63 - 68
  • [8] Microwave dielectric properties of low-loss materials at low temperature
    Geyer, RG
    Krupka, J
    Tobar, M
    ELECTRONIC CERAMIC MATERIALS AND DEVICES, 2000, 106 : 219 - 226
  • [9] A Measurement System For Investigating The Dielectric Properties Of Low-Loss Polymers
    Bini, Marco
    Olmi, Roberto
    Ignesti, Amleto
    Abusleme, Julio
    Bassi, Mattia
    Sanguineti, Aldo
    MATERIALS RESEARCH INNOVATIONS, 2004, 8 (01) : 23 - 26
  • [10] MEASUREMENT OF DIELECTRIC PROPERTIES OF LOW-LOSS CERAMICS AT MICROWAVE FREQUENCIES
    ARON, CP
    WATKINS, J
    PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1965, 112 (06): : 1252 - &
12345