APPLICATION OF THE SCANNING TUNNELING MICROSCOPE TO INSULATING SURFACES

被引：23

作者：

JAKLEVIC, RC ^{[1
]}

ELIE, L ^{[1
]}

SHEN, W ^{[1
]}

CHEN, JT ^{[1
]}

机构：

[1] WAYNE STATE UNIV,DEPT PHYS,DETROIT,MI 48202

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575393

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：448 / 453

页数：6

共 12 条

[1]

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[2]

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[3] SCANNING TUNNELING MICROSCOPY [J].

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[5] SILVER FILMS CONDENSED AT 300-K AND 90-K - SCANNING TUNNELING MICROSCOPY OF THEIR SURFACE-TOPOGRAPHY [J].

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[6] EXPERIMENTAL STUDY OF QUANTUM SIZE EFFECTS IN THIN METAL-FILMS BY ELECTRON TUNNELING [J].

JAKLEVIC, RC ;

LAMBE, J .

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[7] SPECTROSCOPY OF ELECTRONIC STATES OF METALS WITH A SCANNING TUNNELING MICROSCOPE [J].

KAISER, WJ ;

JAKLEVIC, RC .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) :411-416

[8] SCANNING TUNNELING MICROSCOPY STUDY OF METALS - SPECTROSCOPY AND TOPOGRAPHY [J].

KAISER, WJ ;

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SURFACE SCIENCE, 1987, 181 (1-2) :55-68

[9]

KAISER WJ, 1987, SURF SCI, V182, pL227

[10]

Maissel L.I., 1970, HDB THIN FILM TECHNO

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