GROWTH OF AU ON CU(001) STUDIED BY FULL HEMISPHERICAL PHOTOELECTRON DIFFRACTION

被引:21
作者
NAUMOVIC, D
OSTERWALDER, J
STUCK, A
AEBI, P
SCHLAPBACH, L
机构
[1] Institut de Physique, Université de Fribourg
关键词
D O I
10.1016/0039-6028(93)91106-Y
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Ultrathin Au films of 1 to 10 monolayers (ML) have been deposited in situ on Cu(001) at room temperature. Their structure has been investigated by X-ray photoelectron diffraction (XPD), presented as full solid angle intensity maps of the Au 4d5/2 peak, and by low energy electron diffraction. The XPD patterns change from fourfold fcc (001) at low coverage to threefold fcc (111) at high coverage. The goal of this work is to reveal the different steps of such a drastic structure transformation.
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页码:950 / 954
页数:5
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