CHARACTERISTIC FLUORESCENCE CORRECTIONS IN ELECTRON-PROBE MICROANALYSIS

被引:308
作者
REED, SJB
机构
来源
BRITISH JOURNAL OF APPLIED PHYSICS | 1965年 / 16卷 / 07期
关键词
D O I
10.1088/0508-3443/16/7/301
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:913 / &
相关论文
共 6 条
[1]  
BURHOP EHS, 1952, AUGER EFFECT
[2]   PRESENT STATE OF QUANTITATIVE X-RAY MICROANALYSIS .1. PHYSICAL BASIS [J].
DUNCUMB, P ;
SHIELDS, PK .
BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (10) :617-&
[3]   EFFICIENCY OF PRODUCTION OF CHARACTERISTIC X-RADIATION IN THICK TARGETS OF A PURE ELEMENT [J].
GREEN, M ;
COSSLETT, VE .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1961, 78 (505) :1206-&
[4]  
PHILIBERT J, 1962, 3 P INT S XRAY OPT X, P379
[5]  
REED SJB, 1962, 3 INT S XRAY OPT MIC, P317
[6]  
SAGEL K, 1959, TABELLEN RONTGENEMIS