FAULT-DETECTION IN CVS PARITY TREES WITH APPLICATION TO STRONGLY SELF-CHECKING PARITY AND 2-RAIL CHECKERS

被引：4
作者：
JHA, NK
机构：
[1] The Department of Electrical Engineering, Princeton University
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1993年 / 42卷 / 02期
基金：
美国国家科学基金会;
关键词：
CASCODE VOLTAGE SWITCH LOGIC; CONCURRENT ERROR DETECTION; DYNAMIC CMOS; PARITY CHECKER; PARITY TREE; SELF-CHECKING; 2-RAIL CHECKER;
D O I：
10.1109/12.204791
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper the problem of single stuck-at, stuck-open, and stuck-on fault detection in cascode voltage switch (CVS) parity trees is considered. The results are also applied to parity and two-rail checkers. CVS circuits are dynamic CMOS circuits which can implement both inverting and noninverting functions. If the parity tree consists of only differential cascode voltage switch (DCVS) EX-OR gates then we show that the test set consists of at most only five vectors (in some cases only four vectors are required) for detecting all detectable single stuck-at, stuck-open, and stuck-on faults, independent of the number of primary inputs and the number of inputs to any EX-OR gate in the tree. If, however, only a single-ended output is desired from the tree, then the final gate will be a single-ended cascode voltage switch (SCVS) EX-OR gate. For such a tree we show that the test set has only eight vectors. We have already introduced the concept of a strongly self-checking (SSC) property for checkers. We show that for an SSC CVS parity checker, the size of a test set consisting of only codewords is nine, whereas for an SSC CVS two-rail checker the size of a test set consisting of only codewords is at most five.
引用
收藏
页码：179 / 189
页数：11
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