THE DEVELOPMENT OF SECONDARY ION MASS-SPECTROMETRY (SIMS) - A RETROSPECTIVE - COMMENT

被引：0
作者：
GRIES, WH
机构：
来源：
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1986年 / 70卷 / 01期
关键词：
D O I：
10.1016/0168-1176(86)85066-2
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
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页码：115 / 115
页数：1
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