FORMATION AND SCHOTTKY BEHAVIOR OF MANGANESE SILICIDES ON NORMAL-TYPE SILICON

被引:90
作者
EIZENBERG, M [1 ]
TU, KN [1 ]
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
关键词
D O I
10.1063/1.330029
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:6885 / 6890
页数:6
相关论文
共 26 条
[1]   ROLE OF METAL-SEMICONDUCTOR INTERFACE IN SILICON INTEGRATED-CIRCUIT TECHNOLOGY [J].
ANDREWS, JM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (06) :972-984
[2]  
[Anonymous], 1978, HDB BINARY PHASE DIA
[3]  
BABCOCK S, UNPUB
[4]  
BAGLIN J, 1980, THIN FILM INTERFACES
[5]   1 MU-M MOSFET VLSI TECHNOLOGY .7. METAL SILICIDE INTERCONNECTION TECHNOLOGY - FUTURE PERSPECTIVE [J].
CROWDER, BL ;
ZIRINSKY, S .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (04) :369-371
[6]  
Donnay J. D., 1973, CRYSTAL DATA DETERMI, V2
[7]  
Hansen M., 1958, J ELECTROCHEM SOC, DOI DOI 10.1149/1.2428700
[9]   REFRACTORY SILICIDES FOR INTEGRATED-CIRCUITS [J].
MURARKA, SP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (04) :775-792
[10]   MICROSTRUCTURE AND SCHOTTKY-BARRIER HEIGHT OF IRIDIUM SILICIDES FORMED ON SILICON [J].
OHDOMARI, I ;
KUAN, TS ;
TU, KN .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) :7020-7029