LEAST-SQUARES STRUCTURE REFINEMENT BASED ON PROFILE ANALYSIS OF POWDER FILM INTENSITY DATA MEASURED ON AN AUTOMATIC MICRODENSITOMETER

被引：142

作者：

MALMROS, G

THOMAS, JO

机构：

[1] UNIV STOCKHOLM,ARRHENIUS LAB,DEPT STRUCT CHEM,S-10405 STOCKHOLM,SWEDEN

[2] UNIV UPPSALA,INST CHEM,S-75121 UPPSALA,SWEDEN

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1977年 / 10卷 / FEB1期

关键词：

D O I：

10.1107/S0021889877012680

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：7 / 11

页数：5

共 39 条

[1] CRYSTAL-STRUCTURE REFINEMENT BY PROFILE FITTING AND LEAST-SQUARES ANALYSIS OF POWDER DIFFRACTOMETER DATA
WILL, G
PARRISH, W
HUANG, TC
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (DEC) : 611 - 622
[2] APPLICATION OF LEAST-SQUARES METHOD FOR REFINEMENT OF CRYSTAL STRUCTURES FROM POWDER SPECTRUM DATA
BRUSENTS.FA
SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1970, 14 (04): : 581 - &
[3] APPLICATION OF PROFILE LEAST-SQUARES REFINEMENT TECHNIQUE TO POLYCRYSTALLINE NEUTRON-DIFFRACTION DATA
ENGEBRETSEN, JE
PHYSICA NORVEGICA, 1970, 4 (3-4): : 253 - +
[4] THE ANHARMONIC TEMPERATURE FACTOR FOR CRYSTALS WITH THE HEXAGONAL WURTZITE STRUCTURE AND ITS INCLUSION IN MODELS FOR LEAST-SQUARES REFINEMENT OF INTENSITY DATA
FAKINEOS, A
STEVENSON, AW
BARNEA, Z
AUSTRALIAN JOURNAL OF PHYSICS, 1982, 35 (04): : 415 - 424
[5] PROGRAM OF STRUCTURE REFINEMENT BY LEAST-SQUARES METHODS, USING DIFFRACTION DATA FROM A POLYCRYSTAL
TITOV, YG
VERKHORO.LF
MATYUSHE.NN
KRISTALLOGRAFIYA, 1972, 17 (05): : 1053 - &
[6] THE EFFECTS OF WEIGHTING AND OF THE NUMBER OF DATA ON THE LEAST-SQUARES REFINEMENT OF THE STRUCTURE OF CERIC IODATE MONOHYDRATE
IBERS, JA
CROMER, DT
ACTA CRYSTALLOGRAPHICA, 1957, 10 (12): : 749 - 749
[7] MOLECULAR STRUCTURE OF HEXAFLUOROBENZENE - APPLICATION OF LEAST-SQUARES CALCULATION ON ELECTTON DIFFRACTION INTENSITY DATA
ALMENNINGEN, A
BASTIANSEN, O
SEIP, R
SEIP, HM
ACTA CHEMICA SCANDINAVICA, 1964, 18 (09): : 2115 - +
[8] ERROR ANALYSIS OF PHOTOGRAPHIC X-RAY DATA AND ITS EFFECT ON LEAST-SQUARES REFINEMENT
WALLEY, D
ACTA CRYSTALLOGRAPHICA, 1963, 16 (13): : A179 - &
[9] AUTOMATED STRUCTURE-ANALYSIS IN ELECTRON CRYSTALLOGRAPHY - PHASE DETERMINATION WITH THE TANGENT FORMULA AND LEAST-SQUARES REFINEMENT
DORSET, DL
MCCOURT, MP
ACTA CRYSTALLOGRAPHICA SECTION A, 1994, 50 : 287 - 292
[10] LEAST-SQUARES REFINEMENT OF MOLECULAR STRUCTURES FROM GASEOUS ELECTRON-DIFFRACTION SECTOR-MICROPHOTOMETER INTENSITY DATA .2. ADAPTION TO AUTOMATIC COMPUTATION
IWASAKI, M
FRITSCH, FN
HEDBERG, K
ACTA CRYSTALLOGRAPHICA, 1964, 17 (05): : 533 - &

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