SCANNING PROTON-INDUCED X-RAY MICROSPECTROMETRY IN AN ATMOSPHERIC ENVIRONMENT

被引：57
作者：
HOROWITZ, P
GRODZINS, L
机构：
[1] HARVARD UNIV,DEPT PHYS,CAMBRIDGE,MA 02138
[2] MIT,DEPT PHYS,CAMBRIDGE,MA 02139
来源：
SCIENCE | 1975年 / 189卷 / 4205期
关键词：
D O I：
10.1126/science.189.4205.795
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
引用
收藏
页码：795 / 797
页数：3
相关论文
共 9 条
[1]   PROTON MICROBEAMS, THEIR PRODUCTION AND USE [J].
COOKSON, JA ;
FERGUSON, AT ;
PILLING, FD .
JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1972, 12 (01) :39-52
[2]   MICRO-ANALYSIS BY A FLYING-SPOT X-RAY METHOD [J].
COSSLETT, VE ;
DUNCUMB, P .
NATURE, 1956, 177 (4521) :1172-1173
[3]   SENSITIVITY VERSUS TARGET BACKINGS FOR ELEMENTAL ANALYSIS BY ALPHA EXCITED X-RAY-EMISSION [J].
FLOCCHINI, RG ;
FEENEY, PJ ;
SOMMERVILLE, RJ ;
CAHILL, TA .
NUCLEAR INSTRUMENTS & METHODS, 1972, 100 (03) :397-+
[4]   SENSITIVITY IN TRACE-ELEMENT ANALYSIS BY P, ALPHA AND O-16 INDUCED X-RAYS [J].
FOLKMANN, F ;
BORGGREEN, J ;
KJELDGAARD, A .
NUCLEAR INSTRUMENTS & METHODS, 1974, 119 (01) :117-123
[5]   PHOTON-EXCITED ENERGY-DISPERSIVE X-RAY-FLUORESCENCE ANALYSIS FOR TRACE-ELEMENTS [J].
GOULDING, FS ;
JAKLEVIC, JM .
ANNUAL REVIEW OF NUCLEAR AND PARTICLE SCIENCE, 1973, 23 :45-74
[6]   SCANNING X-RAY MICROSCOPE USING SYNCHROTRON RADIATION [J].
HOROWITZ, P .
SCIENCE, 1972, 178 (4061) :608-&
[7]  
HOWELL JA, 1974, THESIS HARVARD U
[8]   X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J].
JOHANSSON, TB ;
AKSELSSON, R ;
JOHANSSON, SA .
NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01) :141-+
[9]  
LONG JVP, 1957, XRAY MICROSCOPY MICR
1