DESIGN OF SELF-CHECKING CIRCUITS FOR TEST DIAGNOSTICS OF DIGITAL DEVICES WITH MEMORY

被引：0
作者：
SPERANSKY, DV
SHATOKHINA, NK
机构：
来源：
AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA | 1985年 / 03期
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D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
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页码：82 / 85
页数：4
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