DESIGN OF SELF-CHECKING CIRCUITS FOR TEST DIAGNOSTICS OF DIGITAL DEVICES WITH MEMORY

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作者：

SPERANSKY, DV

SHATOKHINA, NK

机构：

来源：

AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA | 1985年 / 03期

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中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

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页码：82 / 85

页数：4

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