MEASUREMENT OF THE THERMAL-RESISTANCE OF PACKAGED LASER-DIODES

被引：0
|
作者：
HUGHES, JJ
GILBERT, DB
HAWRYLO, FZ
机构：
[1] RCA Laboratories, Princeton, NJ 08540, United States
来源：
RCA REVIEW | 1985年 / 46卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
LASERS, SEMICONDUCTOR
引用
收藏
页码：200 / 213
页数：14
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