THE DETERMINATION OF OXIDE FILM THICKNESS AND COMPOSITION ON INDIUM AND CHROMIUM BY DECOMPOSITION OF AUGER-ELECTRON SPECTRA

被引：14

作者：

SICONOLFI, DJ

FRANKENTHAL, RP

机构：

来源：

关键词：

D O I：

10.1016/0010-938X(84)90042-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：137 / 144

页数：8

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