SCANNING ACOUSTIC MICROSCOPY - A REVIEW

被引:26
|
作者
WICKRAMASINGHE, HK
机构
来源
JOURNAL OF MICROSCOPY-OXFORD | 1983年 / 129卷 / JAN期
关键词
D O I
10.1111/j.1365-2818.1983.tb04161.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:63 / 73
页数:11
相关论文
共 50 条
  • [41] Industrial Applications of Scanning Acoustic Microscopy
    Severin, F.
    Seviaryna, I.
    Maeva, E.
    MATERIALS EVALUATION, 2013, 71 (07) : 867 - 874
  • [42] SCANNING ACOUSTIC MICROSCOPY OF HUMAN TISSUE
    WHITE, GM
    BARR, RJ
    SHAW, LB
    HARRIS, FL
    LABORATORY INVESTIGATION, 1990, 62 (01) : A106 - A106
  • [43] RECENT PROGRESS IN SCANNING ACOUSTIC MICROSCOPY
    WICKRAMASINGHE, HK
    PHYSICS IN TECHNOLOGY, 1981, 12 (03): : 111 - 113
  • [44] Scanning acoustic microscopy in porous SiC
    Ostapenko, S.
    Smith, M.C.D.
    Tarasov, I.
    Wolan, J.T.
    Mynbaeva, M.
    Goings, J.
    McKeon, J.C.P.
    Saddow, S.E.
    Materials Science Forum, 2002, 389-393 (01) : 687 - 690
  • [45] Scanning acoustic microscopy. I. Fundamentals of the application of the scanning acoustic microscope
    Matthaei, E.
    Vetters, H.
    Mayr, P.
    Praktische Metallographie/Practical Metallography, 1988, 25 (08): : 361 - 373
  • [46] Acoustic properties of aortic aneurysm obtained with scanning acoustic microscopy
    Saijo, Y
    Miyakawa, T
    Sasaki, H
    Tanaka, M
    Nitta, S
    ULTRASONICS, 2004, 42 (1-9) : 695 - 698
  • [47] ACOUSTIC HOLOGRAPHY DEVICE USING SCANNING LASER ACOUSTIC MICROSCOPY
    ORAVECZ, MG
    GIBBONS, L
    KESSLER, LW
    IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 1987, 34 (03) : 413 - 413
  • [48] ACOUSTIC GRAY SCALE FOR SCANNING ACOUSTIC MICROSCOPY AND DIAGNOSTIC ULTRASOUND
    WEGLEIN, RD
    ULTRASONIC IMAGING, 1979, 1 (01) : 89 - 100
  • [49] QUANTITATIVE SCANNING ELECTRON ACOUSTIC MICROSCOPY OF SILICON
    DOMNIK, M
    BALK, LJ
    SCANNING MICROSCOPY, 1993, 7 (01) : 37 - 48
  • [50] ACOUSTIC MICROSCOPY WITH ELECTRONIC SCANNING IN ONE DIRECTION
    CHEEKE, JDN
    GERMAIN, L
    IEEE 1989 ULTRASONICS SYMPOSIUM : PROCEEDINGS, VOLS 1 AND 2, 1989, : 837 - 840