SIMPLE NONLINEAR ANALYSIS OF SINGLE-PHASE FERRORESONANT CIRCUIT

被引:0
作者
FELDMAN, JM
HOPKIN, AM
机构
来源
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS | 1974年 / PA93卷 / 06期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1736 / 1736
页数:1
相关论文
共 50 条
  • [31] Single-phase capacitor clamped inverter with simple structure
    Lin, BR
    Huang, CH
    [J]. 2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 5, PROCEEDINGS, 2004, : 924 - 927
  • [32] SIMPLE SINGLE-PHASE AND HOMOGENEOUS MULTIPHASE BIDIRECTIONAL FLOWMETER
    KENDALL, EJM
    SMEREK, PL
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (06) : 880 - 882
  • [33] SIMPLE TOPOLOGIES FOR SINGLE-PHASE AC LINE CONDITIONING
    CHEN, CC
    DIVAN, DM
    [J]. IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 1994, 30 (02) : 406 - 412
  • [35] A SINGLE-PHASE PULSE-WIDTH-CONTROLLED INVERTER CIRCUIT
    SRIRAGHAVAN, SM
    PRADHAN, BD
    REVANKAR, GN
    [J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 1980, 49 (06) : 503 - 512
  • [36] Study on Harmonic and Reactive Current Detection in Single-Phase Circuit
    Lei Xiao
    Guo Chunlin
    Xu Yonghai
    [J]. ICIEA: 2009 4TH IEEE CONFERENCE ON INDUSTRIAL ELECTRONICS AND APPLICATIONS, VOLS 1-6, 2009, : 2910 - 2914
  • [37] Design and Simulation of Single-phase Photovoltaic (pv) Inverter Circuit
    Xin, Tao
    Du, Hailian
    Lv, Feng
    [J]. FRONTIERS OF MANUFACTURING AND DESIGN SCIENCE, PTS 1-4, 2011, 44-47 : 1928 - 1932
  • [38] 2-STEP JUMPS IN SINGLE-PHASE FERRORESONANCE CIRCUIT
    TADOKORO, M
    [J]. ELECTRICAL ENGINEERING IN JAPAN, 1966, 86 (09) : 86 - &
  • [39] Approach on detection of reactive and harmonic currents in single-phase circuit
    Yu, Han
    Cui, Zhengpai
    Li, Sheng
    Liu, Qihui
    Long, Yunbo
    Zhang, Jianhua
    [J]. IECON 2006 - 32ND ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS, VOLS 1-11, 2006, : 1212 - +
  • [40] Nonlinear Control for Single-Phase Universal Active Filters
    Ketzer, Marcos B.
    Jacobina, Cursino B.
    [J]. IECON 2014 - 40TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, 2014, : 202 - 208