CORRELATION BETWEEN OPTICAL AND TOPOGRAPHICAL IMAGES FROM AN EXTERNAL REFLECTION NEAR-FIELD MICROSCOPE WITH SHEAR FORCE FEEDBACK

被引：36
作者：
BOZHEVOLNYI, SI
SMOLYANINOV, II
KELLER, O
机构：
[1] Institute of Physics, University of Aalborg, Aalborg, DK-9220
来源：
APPLIED OPTICS | 1995年 / 34卷 / 19期
关键词：
SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SCANNING PROBE MICROSCOPY;
D O I：
10.1364/AO.34.003793
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
An external reflection scanning near-field optical microscope with shear force regulation of the tip-surface distance is described. Near-field optical and shear force topographical images are compared for various samples. It is shown that the most important correlative relationships between these images can be deduced from symmetry considerations. The possibility of extracting additional information from the optical images is demonstrated on images of human blood cells.
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收藏
页码：3793 / 3799
页数：7
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