MODEL FOR THE RESISTANCE VARIATION OF A THIN SEMICONDUCTING FILM DURING TEMPERATURE-PROGRAMMED DESORPTION - APPLICATION TO THE O-2-CDSE SYSTEM

被引：11
作者：
FORTIN, B
LARZUL, H
LEBIGOT, J
RAOULT, F
ROSSE, G
机构：
[1] Univ de Rennes I, Groupes, d'Electronique et de Physique des, Materiaux, Rennes, Fr, Univ de Rennes I, Groupes d'Electronique et de Physique des Materiaux, Rennes, Fr
来源：
THIN SOLID FILMS | 1985年 / 131卷 / 1-2期
关键词：
D O I：
10.1016/0040-6090(85)90374-8
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
17
引用
收藏
页码：51 / 67
页数：17
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