METHODS FOR SPECIMEN THICKNESS DETERMINATION IN ELECTRON-MICROSCOPY

被引：29

作者：

BERRIMAN, J

BRYAN, RK

FREEMAN, R

LEONARD, KR

机构：

[1] European Molecular Biology Laboratory (EMBL), D-6900 Heidelberg, Germany

来源：

ULTRAMICROSCOPY | 1984年 / 13卷 / 04期

关键词：

D O I：

10.1016/0304-3991(84)90001-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A new method is described for specimen thickness determination in transmission electron microscopy. This is carried out by marking specimens with gold particles and analyzing the images of a tilt series by computer. The method makes it possible to distinguish populations of particles on different planes and calculate the distance between the planes with statistical variation. We have applied it to carbon films as test objects and compared the results with those obtained by transverse sectioning, STEM mass measurement, optical density and frequency change of a quartz crystal oscillator. We have then used the method for thickness measurement of multilayered protein crystals and thin sectioned cells.

引用

页码：351 / 364

页数：14

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