X-RAY SPECTROSCOPIC INVESTIGATION OF STRUCTURE OF SILICA, SILICATES AND OXIDES IN CRYSTALLINE AND VITREOUS STATE

被引：25

作者：

WIECH, G

ZOPF, E

CHUN, HU

BRUCKNER, R

机构：

[1] UNIV MUNCHEN,SEKT PHYS,MUNCHEN,FED REP GER

[2] TECH UNIV BERLIN,INST NICHT MET WERKSTOFFE,D-1000 BERLIN 12,FED REP GER

[3] UNIV FRANKFURT,INST PHYS CHEM,D-6000 FRANKFURT,FED REP GER

来源：

关键词：

D O I：

10.1016/0022-3093(76)90046-6

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：251 / 261

页数：11

共 13 条

[1]

Bruckner R., 1971, Journal of Non-Crystalline Solids, V5, P281, DOI 10.1016/0022-3093(71)90068-8

[2]

Bruckner R., 1971, Journal of Non-Crystalline Solids, V5, P177, DOI 10.1016/0022-3093(71)90032-9

[3]

Bruckner R., 1970, Journal of Non-Crystalline Solids, V5, P123, DOI 10.1016/0022-3093(70)90190-0

[4]

BRUCKNER R, 1969, GLASTECH BER, V42, P322

[5]

CHUN HU, 1967, Z NATURFORSCH PT A, VA 22, P1401

[6] PHOTOEMISSION MEASUREMENTS OF VALENCE LEVELS OF AMORPHOUS SIO2 [J].

DISTEFANO, TH ;

EASTMAN, DE .

[7]

DUDEK HJ, 1972, GLASTECHN BER, V45, P10

[8]

EITEL W, 1965, SILICATE SCI, V2

[9]

HAMMEL JJ, 1965, 7TH P INT C GLASS BR

[10]

LAUGER K, 1968, THESIS MUNCHEN