TOPOGRAPHIC INTENSITY PROFILES IN SCANNING ELECTRON MICROSCOPE CUBES

[1] BRUINING H, 1954, PHYSICS APPLICATIONS

[2] RESOLUTION LIMITS IN SURFACE SCANNING ELECTRON-MICROSCOPE [J]. JOURNAL OF MICROSCOPY-OXFORD, 1973, 98 (AUG): : 417 - 435

[3] COLBY JW, 1969, ADV ELECTRON ELEC S6, P177

[4] DRESCHER H, 1970, Z ANGEW PHYSIK, V29, P331

[5] Evekhart T.E., 1959, J ELECT CONTROL, V7, P97, DOI 10.1080/00207215908937191

[6] AN IMPROVED SCANNING ELECTRON MICROSCOPE FOR OPAQUE SPECIMENS [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1953, 100 (75): : 245 - 259

[7] Murata K., 1973, Scanning Electron Microscopy 1973, P267

[8] STUDY ON RESOLUTION OF BACKSCATTERED ELECTRON IMAGE BY MONTE CARLO METHOD [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (09) : 1290 - +

[9] MONTE CARLO CALCULATIONS ON ELECTRON SCATTERING IN A SOLID TARGET [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (06) : 678 - +

[10] REIMER L, 1973, RASTER ELEKTRONENMIK

[1] BRUINING H, 1954, PHYSICS APPLICATIONS

[2] RESOLUTION LIMITS IN SURFACE SCANNING ELECTRON-MICROSCOPE [J]. JOURNAL OF MICROSCOPY-OXFORD, 1973, 98 (AUG): : 417 - 435

[3] COLBY JW, 1969, ADV ELECTRON ELEC S6, P177

[4] DRESCHER H, 1970, Z ANGEW PHYSIK, V29, P331

[5] Evekhart T.E., 1959, J ELECT CONTROL, V7, P97, DOI 10.1080/00207215908937191

[6] AN IMPROVED SCANNING ELECTRON MICROSCOPE FOR OPAQUE SPECIMENS [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1953, 100 (75): : 245 - 259

[7] Murata K., 1973, Scanning Electron Microscopy 1973, P267

[8] STUDY ON RESOLUTION OF BACKSCATTERED ELECTRON IMAGE BY MONTE CARLO METHOD [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (09) : 1290 - +

[9] MONTE CARLO CALCULATIONS ON ELECTRON SCATTERING IN A SOLID TARGET [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (06) : 678 - +

[10] REIMER L, 1973, RASTER ELEKTRONENMIK