THE COMPLEXITY OF FAULT-DETECTION PROBLEMS FOR COMBINATIONAL LOGIC-CIRCUITS

被引：1

作者：

FUJIWARA, H ^{[1
]}

TOIDA, S ^{[1
]}

机构：

[1] UNIV WATERLOO,DEPT SYST DESIGN,WATERLOO N2L 3G1,ONTARIO,CANADA

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1982年 / 31卷 / 06期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：555 / 560

页数：6

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