THE COMPLEXITY OF FAULT-DETECTION PROBLEMS FOR COMBINATIONAL LOGIC-CIRCUITS

被引：2

作者：

FUJIWARA, H ^{[1
]}

TOIDA, S ^{[1
]}

机构：

[1] UNIV WATERLOO,DEPT SYST DESIGN,WATERLOO N2L 3G1,ONTARIO,CANADA

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1982年 / 31卷 / 06期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：555 / 560

页数：6

共 50 条

[1] INITIAL FAULT-DETECTION IN ARBITRARY CLASSES OF COMBINATIONAL LOGIC-CIRCUITS
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AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 1978, (01): : 41 - 41
[2] STATISTICAL FAULT-DETECTION IN LOGIC-CIRCUITS WITH NONSTATIONARY INPUT ACTIONS
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OSTAJIN, VA
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[3] DESIGNING SETS OF FAULT-DETECTION TESTS FOR COMBINATIONAL LOGIC CIRCUITS
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IEEE TRANSACTIONS ON COMPUTERS, 1971, C 20 (12) : 1463 - +
[4] MULTIPLE STUCK-OPEN FAULT-DETECTION IN CMOS LOGIC-CIRCUITS
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[5] A FAULT-DETECTION TEST FOR COMBINATIONAL-CIRCUITS
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[6] COMPUTER METHOD FOR FAULT-DETECTION IN COMBINATIONAL CIRCUITS
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[7] MULTIPLE FAULT-DETECTION FOR IRREDUNDANT AND REDUNDANT COMBINATIONAL CIRCUITS
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IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1976, 12 (02) : 306 - 306
[8] FAULT-DETECTION IN COMBINATIONAL-CIRCUITS USING GUNN-EFFECT LOGIC DEVICES
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ELECTRONICS LETTERS, 1981, 17 (06) : 222 - 223
[9] FAULT-DETECTION IN COMBINATIONAL CIRCUITS USING BOOLEAN MATRICES
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MICROELECTRONICS RELIABILITY, 1978, 18 (04) : 323 - 324
[10] WIDTH AND DEPTH OF COMBINATIONAL LOGIC-CIRCUITS
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INFORMATION PROCESSING LETTERS, 1981, 13 (4-5) : 191 - 194

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