GO/NO-GO TESTING OF ANALOG MACROS

被引：14
作者：
ALQUTAYRI, MA
SHEPHERD, PR
机构：
[1] Univ of Bath, Bath
来源：
IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS | 1992年 / 139卷 / 04期
关键词：
ANALOG COMPUTERS AND COMPUTATION; MACROS;
D O I：
10.1049/ip-g-2.1992.0083
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A time-domain go/no-go testing strategy for analogue integrated circuit macros is presented. The strategy is based on exciting an analogue macro with a pseudo-random binary sequence and measuring the transient response generated at the external nodes, thereby eliminating the need for intermediate probing. Four methods of analysing the transient response data are discussed. Of these methods, the response digitisation is the most efficient.
引用
收藏
页码：534 / 550
页数：17
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