X-RAY-DIFFRACTION PATTERN OF DRAGON LATTICE

被引：4
作者：
TERAUCHI, H [1 ]
ISHIDA, M [1 ]
KAMIGAKI, K [1 ]
KATO, H [1 ]
SANO, N [1 ]
机构：
[1] SHARP CO LTD,CENT RES LABS,TENRI 632,JAPAN
来源：
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1992年 / 61卷 / 04期
关键词：
DRAGON LATTICE; ONE-DIMENSIONAL QUASI-PERIODIC LATTICE; MOLECULAR BEAM EPITAXY; X-RAY DIFFRACTION;
D O I：
10.1143/JPSJ.61.1141
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A new quasi-periodic dragon lattice was grown by means of molecular beam epitaxy and examined carefully by high resolution X-ray diffraction. The diffraction pattern shows many satellite peaks, which are symmetric around 1/2, 1/4, 1/8,..., 1/2p with p integer and are assigned by (2k + 1)/2p with k and p integers. The characteristics of the dragon lattice are discussed in terms of the correlation function and compared to other one-dimensional quasi-periodic lattices.
引用
收藏
页码：1141 / 1144
页数：4
相关论文
共 50 条
  • [41] X-RAY-DIFFRACTION STRUCTURAL-ANALYSIS OF LANGMUIR-BLODGETT-FILMS USING A PATTERN-RECOGNITION APPROACH
    MACCIONI, E
    MARIANI, P
    RUSTICHELLI, F
    DELACROIX, H
    TROITSKY, V
    RICCIO, A
    GAMBACORTA, A
    DEROSA, M
    THIN SOLID FILMS, 1995, 265 (1-2) : 74 - 83
  • [42] X-RAY-DIFFRACTION STUDIES OF MISCUT CRYSTAL-SURFACES AND OVERLAYERS - A DYNAMICAL DIFFRACTION APPROACH
    KAU, CP
    GAU, TS
    CHANG, SL
    MATERIALS CHEMISTRY AND PHYSICS, 1995, 41 (02) : 128 - 133
  • [43] ANOMALOUS BEHAVIOR OF SILICON SINGLE-CRYSTALS OBSERVED BY X-RAY-DIFFRACTION
    KOHNO, A
    AOMINE, N
    SOEJIMA, Y
    OKAZAKI, A
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (9A): : 5073 - 5077
  • [44] THE IDENTIFICATION OF PHONON PHONON INTERACTIONS IN ANHARMONIC CRYSTALS BY X-RAY-DIFFRACTION DATA
    TSARKOV, AG
    TSIRELSON, VG
    ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1993, 48 (1-2): : 21 - 24
  • [45] X-RAY-DIFFRACTION STUDY ON THE FRAMEWORK STRUCTURE OF AMORPHOUS TUNGSTEN TRIOXIDE FILMS
    NANBA, T
    TAKAHASHI, T
    TAKANO, S
    TAKADA, J
    OSAKA, A
    MIURA, Y
    KUDO, T
    YASUI, I
    JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 1995, 103 (03) : 222 - 229
  • [46] A QUANTITATIVE X-RAY-DIFFRACTION TECHNIQUE FOR ANALYZING SEDIMENTARY-ROCKS AND SOILS
    BURNETT, AD
    JOURNAL OF TESTING AND EVALUATION, 1995, 23 (02) : 111 - 118
  • [47] X-RAY-DIFFRACTION AND ELECTRON-MICROSCOPE STUDY OF OSTEONS DURING CALCIFICATION
    ASCENZI, A
    BONUCCI, E
    RIPAMONTI, A
    ROVERI, N
    CALCIFIED TISSUE RESEARCH, 1978, 25 (02): : 133 - 143
  • [48] EX-SITU X-RAY-DIFFRACTION OF ELECTROCHEMICALLY FORMED FILMS ON COPPER
    NAHLE, A
    BULLETIN OF ELECTROCHEMISTRY, 1994, 10 (9-10): : 401 - 408
  • [49] X-RAY-DIFFRACTION IN LABORATORY OF IRON-STEEL AND PIPE WORKS SISAK
    NOVOSELRADOVIC, V
    STROJARSTVO, 1994, 36 (1-2): : 69 - 76
  • [50] X-RAY-DIFFRACTION MEASUREMENTS FOR EXPANDED FLUID SELENIUM UP TO THE SUPERCRITICAL REGION
    TAMURA, K
    HOSOKAWA, S
    BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1992, 96 (05): : 681 - 688
12345