ATOMIC-STRUCTURE AND PROPERTIES OF EPITAXIAL THIN-FILM SEMICONDUCTOR INTERFACES

被引：6
|
作者：
GIBSON, JM
TUNG, RT
PHILLIPS, JM
HULL, R
机构：
来源：
JOURNAL DE PHYSIQUE | 1985年 / 46卷 / NC-4期
关键词：
D O I：
10.1051/jphyscol:1985440
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学科分类号：
摘要：
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页码：369 / 377
页数：9
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