A SIMPLIFIED METHOD FOR QUANTUM SIZE EFFECT ANALYSIS IN SUB-MICRON DEVICES

被引：5
|
作者：
LUI, WW [1 ]
FREY, J [1 ]
机构：
[1] UNIV MARYLAND, DEPT ELECT ENGN, COLLEGE PK, MD 20742 USA
来源：
JOURNAL OF APPLIED PHYSICS | 1988年 / 64卷 / 12期
关键词：
D O I：
10.1063/1.342014
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：6790 / 6794
页数：5
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