MULTIPLE-WAVELENGTH ELLIPSOMETRY IN THIN UNIAXIAL NONABSORBING FILMS

被引：18

作者：

ANTIPPA, AF ^{[1
]}

LEBLANC, RM ^{[1
]}

DUCHARME, D ^{[1
]}

机构：

[1] UNIV QUEBEC,CTR RECH PHOTOBIOPHYS,TROIS RIVIERES GA9 5H7,QUEBEC,CANADA

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1986年 / 3卷 / 11期

关键词：

D O I：

10.1364/JOSAA.3.001794

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1794 / 1802

页数：9

共 6 条

[1] ASPNES DE, 1981, SPIE P, V276, P188
[2] CHARACTERIZATION OF A VERY THIN UNIAXIAL FILM ON A NON-ABSORBING SUBSTRATE BY MULTIPLE WAVELENGTH ELLIPSOMETRY - PALMITIC ACID ON WATER
AYOUB, GT
BASHARA, NM
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1978, 68 (07) : 978 - 983
[3] SPECULAR REFLECTANCE AND ELLIPSOMETRIC SPECTROSCOPY OF ORIENTED MOLECULAR LAYERS
DIGNAM, MJ
MOSKOVITS, M
STOBIE, RW
[J]. TRANSACTIONS OF THE FARADAY SOCIETY, 1971, 67 (587): : 3306 - +
[4] HILDEBRAND FB, 1952, METHODS APPLIED MATH
[5] MORSE PM, 1953, METHODS THEORETICAL, V1, P374
[6] ZIMAN JM, 1964, PRINCIPLES THEORY SO, P223