THE SINGLE-SCATTERING MODEL AND SPATIAL-RESOLUTION IN X-RAY-ANALYSIS OF THIN FOILS

被引：84
作者：
REED, SJB
机构：
来源：
ULTRAMICROSCOPY | 1982年 / 7卷 / 04期
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D O I：
10.1016/0304-3991(82)90263-7
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：405 / 409
页数：5
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