COMPARISON OF TRANSVERSE-ELECTRON-FOCUSING AND SCANNING-TUNNELING-MICROSCOPY MEASUREMENTS ON AG(001) AND (011) SURFACES

被引：26

作者：

BENISTANT, PAM ^{[1
]}

VANDEWALLE, GFA ^{[1
]}

VANKEMPEN, H ^{[1
]}

WYDER, P ^{[1
]}

机构：

[1] MAX PLANCK INST FESKORPERFORSCH,HOCHFELD MAGNETLAB,F-38042 GRENOBLE,FRANCE

来源：

PHYSICAL REVIEW B | 1986年 / 33卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.33.690

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：690 / 694

页数：5

共 18 条

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[8] REFLECTION OF CONDUCTION ELECTRONS FROM AN ATOMICALLY CLEAN SURFACE OF A TUNGSTEN CRYSTAL [J].

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PANCHENKO, OA ;

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TSOI, VS .

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[9] TRANSVERSE ELECTRON FOCUSING IN ZINC SINGLE-CRYSTALS [J].

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[10]

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