MEASUREMENT OF SEMICONDUCTOR HETEROJUNCTION BAND DISCONTINUITIES BY X-RAY PHOTOEMISSION SPECTROSCOPY

被引：138
作者：
WALDROP, JR
GRANT, RW
KOWALCZYK, SP
KRAUT, EA
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1985年 / 3卷 / 03期
关键词：
D O I：
10.1116/1.573326
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：835 / 841
页数：7
相关论文
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