X-RAY PHOTOELECTRON DIFFRACTION AT HIGH ANGULAR RESOLUTION

被引：44

作者：

OSTERWALDER, J ^{[1
]}

STEWART, EA ^{[1
]}

CYR, D ^{[1
]}

FADLEY, CS ^{[1
]}

DELEON, JM ^{[1
]}

REHR, JJ ^{[1
]}

机构：

[1] UNIV WASHINGTON,DEPT PHYS,SEATTLE,WA 98195

来源：

PHYSICAL REVIEW B | 1987年 / 35卷 / 18期

关键词：

D O I：

10.1103/PhysRevB.35.9859

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：9859 / 9862

页数：4

共 23 条

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