A CHEMICAL THINNING TECHNIQUE FOR TRANSMISSION ELECTRON-MICROSCOPY CROSS-SECTIONAL SAMPLES

被引：1

作者：

GABORIAUD, RJ ^{[1
]}

机构：

[1] CALTECH,PASADENA,CA 91125

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1983年 / 12卷 / 05期

关键词：

D O I：

10.1007/BF02655297

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：837 / 844

页数：8

共 50 条

[31] TRANSMISSION ELECTRON-MICROSCOPY CROSS-SECTIONAL OBSERVATION ON MECHANICALLY AND CHEMICALLY LAPPED SI (111) SURFACES
WU, XJ
HORIUCHI, S
SHIWAKU, H
HYODO, K
ANDO, M
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1992, 31 (6B): : L803 - L806
[32] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF THIN-FILM POLYCRYSTALLINE SEMICONDUCTORS BY CONVENTIONAL MICROTOMY
ALBUYARON, A
FRANK, A
NOUFI, R
THIN SOLID FILMS, 1993, 227 (01) : 18 - 23
[33] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF PRECISELY SELECTED REGIONS FROM SEMICONDUCTOR-DEVICES
KIRK, ECG
WILLIAMS, DA
AHMED, H
MICROSCOPY OF SEMICONDUCTING MATERIALS 1989, 1989, 100 : 501 - 506
[34] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF PRECISELY SELECTED REGIONS FROM SEMICONDUCTOR-DEVICES
KIRK, ECG
WILLIAMS, DA
AHMED, H
INSTITUTE OF PHYSICS CONFERENCE SERIES, 1989, (100): : 501 - 506
[35] INVESTIGATION OF MULTILAYER METALLIZATION IN A GATE ARRAY DEVICE USING CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
GONG, SF
HENTZELL, HTG
ROBERTSSON, A
RADNOCZI, G
IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS, 1990, 137 (01): : 53 - 56
[36] CROSS-SECTIONAL HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY OF THE STRUCTURES OF CARBON NANOTUBES
BURSILL, LA
PENG, JL
FAN, XD
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1995, 71 (05): : 1161 - 1176
[37] CONTACT DAMAGE IN SINGLE-CRYSTALLINE SILICON INVESTIGATED BY CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
JOHANSSON, S
SCHWEITZ, JA
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1988, 71 (08) : 617 - 623
[38] Preparation of cross-sectional samples from metal-metal-composites for transmission electron microscopy
Stangl, E
Spiradek, K
Brabetz, M
EUROPEAN JOURNAL OF CELL BIOLOGY, 1997, 74 : 129 - 129
[39] THINNING OF ALUMINUM POWDER PARTICLES FOR TRANSMISSION ELECTRON-MICROSCOPY
KIRCHOFF, SD
ADKINS, JY
METALLOGRAPHY, 1987, 20 (01): : 75 - 87
[40] A CHEMICAL THINNING TECHNIQUE FOR PREPARATION OF THIN METAL FOILS FOR TRANSMISSION ELECTRON MICROSCOPY
KEOWN, SR
PICKERING, FB
JOURNAL OF THE IRON AND STEEL INSTITUTE, 1962, 200 (09): : 757 - &

← 1 2 3 4 5 →