A CHEMICAL THINNING TECHNIQUE FOR TRANSMISSION ELECTRON-MICROSCOPY CROSS-SECTIONAL SAMPLES

被引:1
|
作者
GABORIAUD, RJ [1 ]
机构
[1] CALTECH,PASADENA,CA 91125
关键词
D O I
10.1007/BF02655297
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:837 / 844
页数:8
相关论文
共 50 条
  • [21] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY INVESTIGATIONS OF RF-SPUTTERED AC FILMS
    GRUNEWALD, W
    ULLMANN, J
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1990, 122 (02): : K129 - &
  • [22] PREPARATION OF CROSS-SECTIONAL SPECIMENS OF CERAMIC THERMAL BARRIER COATINGS FOR TRANSMISSION ELECTRON-MICROSCOPY
    UNAL, O
    HEUER, AH
    MITCHELL, TE
    JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1990, 14 (04): : 307 - 312
  • [23] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY INVESTIGATION OF XENON IRRADIATED GLASSY-CARBON
    MCCULLOCH, D
    PRAWER, S
    HOFFMAN, A
    SOOD, DK
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 80-1 : 1480 - 1484
  • [24] SURFACE-DEFECTS IN POLISHED SILICON STUDIED BY CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
    JOHANSSON, S
    SCHWEITZ, JA
    LAGERLOF, KPD
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1989, 72 (07) : 1136 - 1139
  • [25] SI-SIO2 INTERFACE EXAMINED BY CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
    BLANC, J
    BUIOCCHI, CJ
    ABRAHAMS, MS
    HAM, WE
    APPLIED PHYSICS LETTERS, 1977, 30 (02) : 120 - 122
  • [27] LOCALIZED THINNING OF GAAS/GAALAS NANOSTRUCTURES BY A COMBINED SCANNING ELECTRON MICROGRAPH FOCUS ION-BEAM SYSTEM FOR HIGH-QUALITY CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY SAMPLES
    ASSAYAG, GB
    VIEU, C
    GIERAK, J
    CHAABANE, H
    PEPIN, A
    HENOC, P
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (03): : 531 - 535
  • [28] MODIFIED DOUBLE-JET ELECTROLYTIC THINNING TECHNIQUE FOR TRANSMISSION ELECTRON-MICROSCOPY
    MASTENBROEK, A
    HAMBURG, G
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (01): : 10 - +
  • [29] CHEMICAL THINNING OF III-V COMPOUND SEMICONDUCTORS FOR TRANSMISSION ELECTRON-MICROSCOPY
    WAGNER, G
    DREILICH, A
    BUTTER, E
    JOURNAL OF MATERIALS SCIENCE, 1988, 23 (08) : 2761 - 2767
  • [30] COMPARISON OF DAMAGE PROFILES OBTAINED BY ANGLE LAPPING STAINING AND CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
    CARTER, CH
    MASZARA, W
    ROZGONYI, GA
    SADANA, DK
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 463 : 106 - 112