A CHEMICAL THINNING TECHNIQUE FOR TRANSMISSION ELECTRON-MICROSCOPY CROSS-SECTIONAL SAMPLES

被引：1

作者：

GABORIAUD, RJ ^{[1
]}

机构：

[1] CALTECH,PASADENA,CA 91125

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1983年 / 12卷 / 05期

关键词：

D O I：

10.1007/BF02655297

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：837 / 844

页数：8

共 50 条

[1] A NEW CROSS-SECTIONAL THINNING TECHNIQUE FOR TRANSMISSION ELECTRON-MICROSCOPY
SWEENEY, J
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (03): : 918 - 920
[2] LOCALIZED THINNING OF SEMICONDUCTOR NANOSTRUCTURES FOR CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
VIEU, C
PEPIN, A
BENASSAYAG, G
GIERAK, J
LADAN, FR
MICROSCOPY OF SEMICONDUCTING MATERIALS 1993, 1993, (134): : 385 - 390
[3] CROSS-SECTIONAL SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY
ABRAHAMS, MS
BUIOCCHI, CJ
JOURNAL OF APPLIED PHYSICS, 1974, 45 (08) : 3315 - 3316
[4] A NOVEL TECHNIQUE FOR THE PREPARATION OF THIN-FILMS FOR CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
HEUER, JP
HOWITT, DG
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1990, 14 (01): : 79 - 82
[5] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY FOR POLYCRYSTALLINE SILICON FILMS
OPPOLZER, H
FALCKENBERG, R
DOERING, E
JOURNAL OF MICROSCOPY-OXFORD, 1980, 118 (JAN): : 97 - 103
[6] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF METALLIC MULTILAYERS
DEVEIRMAN, AEM
HAKKENS, FJG
DIRKS, AG
ULTRAMICROSCOPY, 1993, 51 (1-4) : 306 - 315
[7] SAMPLE PREPARATION TECHNIQUE FOR CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF QUANTUM-WIRE STRUCTURES
CHEN, YP
REED, JD
OKEEFE, SS
SCHAFF, WJ
EASTMAN, LF
MICROSCOPY RESEARCH AND TECHNIQUE, 1993, 26 (02) : 157 - 161
[8] IMPROVED TECHNIQUE FOR CROSS-SECTIONAL IMAGING OF THIN POLYMER-FILMS BY TRANSMISSION ELECTRON-MICROSCOPY
KUNZ, M
SHULL, K
POLYMER, 1993, 34 (11) : 2427 - 2430
[9] PREPARATION OF CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY SAMPLES BY ELECTRON-BEAM LITHOGRAPHY AND REACTIVE ION ETCHING
WETZEL, JT
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 11 (01): : 62 - 69
[10] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF SILICON-SILICIDE INTERFACES
FOLL, F
HO, PS
TU, KN
JOURNAL OF APPLIED PHYSICS, 1981, 52 (01) : 250 - 255

← 1 2 3 4 5 →