ABSOLUTE MEASUREMENT OF STRUCTURE FACTORS OF SI SINGLE CRYSTAL BY MEANS OF X-RAY PENDELLOSUNG FRINGES

被引：93

作者：

HATTORI, H

KURIYAMA, H

KATAGAWA, T

机构：

来源：

关键词：

D O I：

10.1143/JPSJ.20.988

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：988 / &

共 20 条

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