ABSOLUTE MEASUREMENT OF STRUCTURE FACTORS OF SI SINGLE CRYSTAL BY MEANS OF X-RAY PENDELLOSUNG FRINGES

被引：93
作者：
HATTORI, H
KURIYAMA, H
KATAGAWA, T
机构：
来源：
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1965年 / 20卷 / 06期
关键词：
D O I：
10.1143/JPSJ.20.988
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：988 / &
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