ABSOLUTE MEASUREMENT OF STRUCTURE FACTORS OF SI SINGLE CRYSTAL BY MEANS OF X-RAY PENDELLOSUNG FRINGES

被引：93
作者：
HATTORI, H
KURIYAMA, H
KATAGAWA, T
机构：
来源：
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1965年 / 20卷 / 06期
关键词：
D O I：
10.1143/JPSJ.20.988
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：988 / &
相关论文
共 20 条
[1]   EFFECT OF THERMAL VIBRATIONS ON DIFFRACTION FROM PERFECT CRYSTALS .2. BRAGG CASE OF REFLECTION [J].
BATTERMAN, BW .
PHYSICAL REVIEW, 1962, 127 (03) :686-&
[2]   VIBRATIONAL AMPLITUDES IN GERMANIUM AND SILICON [J].
BATTERMAN, BW ;
CHIPMAN, DR .
PHYSICAL REVIEW, 1962, 127 (03) :690-&
[3]  
Brill R, 1939, ANN PHYS-BERLIN, V34, P393
[4]   ON THE INFLUENCE OF BINDING ELECTRONS ON X-RAY INTENSITIES [J].
BRILL, R .
ACTA CRYSTALLOGRAPHICA, 1960, 13 (03) :275-276
[5]   INTENSITY OF THE (III) REFLEXION FOR DIAMOND [J].
BRILL, R ;
BARTH, H .
NATURE, 1959, 184 (4682) :264-264
[6]  
COWLEY JM, 1958, 21 REP PROGR PHYS, P165
[7]  
Ewald PP, 1936, ANN PHYS-BERLIN, V25, P0281
[8]  
Ewald PP, 1916, ANN PHYS-BERLIN, V49, P117
[9]  
EWALD PP, 1936, ANN PHYSIK, V26, P173
[10]  
GOTTLICHER S, 1959, Z ELEKTROCHEM, V63, P891
12