LOCALIZED EPITAXIAL-GROWTH OF TASI2 ON (111) AND (001)SI BY RAPID THERMAL ANNEALING

被引:10
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WU, IC
CHU, JJ
CHEN, LJ
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10.1063/1.339693
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O59 [应用物理学];
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页码:879 / 883
页数:5
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共 19 条
[1]  
CHANG CA, UNPUB
[2]   EPITAXIAL-GROWTH OF ZRSI2 ON SILICON WITH AN ION-BEAM MIXING ASSISTED SCHEME [J].
CHENG, HC ;
CHEN, LJ .
APPLIED PHYSICS LETTERS, 1985, 46 (06) :562-564
[3]  
CHIEN CJ, 1985, J APPL PHYS, V57, P1877
[4]   REFRACTORY-METAL SILICIDES - THIN-FILM PROPERTIES AND PROCESSING TECHNOLOGY [J].
CHOW, TP ;
STECKL, AJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (11) :1480-1497
[5]  
DHEURLE FM, 1986, MATER RES SOC S P, V52, P261
[6]  
FAN JCC, 1985, MRS P, V35, P39
[7]   LOCALIZED EPITAXIAL-GROWTH OF C54 AND C49 TISI2 ON (111)SI [J].
FUNG, MS ;
CHENG, HC ;
CHEN, LJ .
APPLIED PHYSICS LETTERS, 1985, 47 (12) :1312-1314
[8]   CORRELATION OF SCHOTTKY-BARRIER HEIGHT AND MICROSTRUCTURE IN THE EPITAXIAL NI SILICIDE ON SI(111) [J].
LIEHR, M ;
SCHMID, PE ;
LEGOUES, FK ;
HO, PS .
PHYSICAL REVIEW LETTERS, 1985, 54 (19) :2139-2142
[9]   LOCALIZED EPITAXIAL-GROWTH OF HEXAGONAL AND TETRAGONAL MOSI2 ON (111) SI [J].
LIN, WT ;
CHEN, LJ .
APPLIED PHYSICS LETTERS, 1985, 46 (11) :1061-1063
[10]   LOCALIZED EPITAXIAL-GROWTH OF TETRAGONAL AND HEXAGONAL WSI2 ON (111)SI [J].
LIN, WT ;
CHEN, LJ .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (04) :1515-1518