USE OF RUTHERFORD SCATTERING ON A SECONDARY CARBON TARGET FOR CORRECTING INTERMEDIATE THICKNESS SAMPLE PIXE MEASUREMENTS

被引：23
作者：
ALOUPOGIANNIS, P [1 ]
ROBAYE, G [1 ]
ROELANDTS, I [1 ]
WEBER, G [1 ]
DELBROUCKHABARU, JM [1 ]
QUISEFIT, JP [1 ]
机构：
[1] UNIV PARIS 07,CHIM MILIEUX NAT LAB,CNRS,PHYSICOCHIM ATMOSPHERE LAB,F-75251 PARIS 05,FRANCE
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1986年 / 14卷 / 03期
关键词：
D O I：
10.1016/0168-583X(86)90598-7
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：297 / 303
页数：7
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