SURFACE EXTENDED ELECTRON LOSS FINE-STRUCTURE - DEPENDENCE ON INCIDENT ELECTRON-ENERGY AND COLLECTION SOLID ANGLE

[1] COLLIEX C, 1972, PHILOS MAG, V25, P491, DOI 10.1080/14786437208226818

[2] De Crescenzi M., 1983, EXAFS and Near Edge Structures. Proceedings of the International Conference, P382

[3] EXTENDED FINE-STRUCTURES ABOVE TI L2,3 EDGE - A COMPARISON BETWEEN REFLECTION ENERGY-LOSS AND EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE RESULTS [J]. PHYSICAL REVIEW B, 1984, 29 (06): : 3730 - 3732

[4] SURFACE EXTENDED ENERGY-LOSS FINE-STRUCTURES OF OXYGEN ON NI(100) [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (24) : 1949 - 1952

[5] DECRESCENZI M, 1982, SOLID STATE COMMUN, V44, P285

[6] Einstein T. L., 1983, EXAFS and Near Edge Structures. Proceedings of the International Conference, P391

[7] EXTENDED ABSORPTION FINE-STRUCTURE ANALYSIS OF SURFACE-STRUCTURE [J]. APPLICATIONS OF SURFACE SCIENCE, 1982, 11-2 (JUL): : 42 - 63

[8] COMMENT ON EXAFS AND EXELFS ABOVE MII,III-EDGES IN CU AND NI [J]. SOLID STATE COMMUNICATIONS, 1983, 45 (12) : 1083 - 1084

[9] OPTIMIZATION OF DATA END-POINTS AND TAPER WIDTH IN EXTENDED ABSORPTION FINE-STRUCTURE ANALYSIS [J]. PHYSICAL REVIEW B, 1984, 29 (02): : 1048 - 1049

[10] HITCHCOCK AP, UNPUB

[1] COLLIEX C, 1972, PHILOS MAG, V25, P491, DOI 10.1080/14786437208226818

[2] De Crescenzi M., 1983, EXAFS and Near Edge Structures. Proceedings of the International Conference, P382

[3] EXTENDED FINE-STRUCTURES ABOVE TI L2,3 EDGE - A COMPARISON BETWEEN REFLECTION ENERGY-LOSS AND EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE RESULTS [J]. PHYSICAL REVIEW B, 1984, 29 (06): : 3730 - 3732

[4] SURFACE EXTENDED ENERGY-LOSS FINE-STRUCTURES OF OXYGEN ON NI(100) [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (24) : 1949 - 1952

[5] DECRESCENZI M, 1982, SOLID STATE COMMUN, V44, P285

[6] Einstein T. L., 1983, EXAFS and Near Edge Structures. Proceedings of the International Conference, P391

[7] EXTENDED ABSORPTION FINE-STRUCTURE ANALYSIS OF SURFACE-STRUCTURE [J]. APPLICATIONS OF SURFACE SCIENCE, 1982, 11-2 (JUL): : 42 - 63

[8] COMMENT ON EXAFS AND EXELFS ABOVE MII,III-EDGES IN CU AND NI [J]. SOLID STATE COMMUNICATIONS, 1983, 45 (12) : 1083 - 1084

[9] OPTIMIZATION OF DATA END-POINTS AND TAPER WIDTH IN EXTENDED ABSORPTION FINE-STRUCTURE ANALYSIS [J]. PHYSICAL REVIEW B, 1984, 29 (02): : 1048 - 1049

[10] HITCHCOCK AP, UNPUB