ABSOLUTE ONSET OF OPTICAL-SURFACE DAMAGE USING DISTRIBUTED DEFECT ENSEMBLES

被引：119

作者：

PORTEUS, JO

SEITEL, SC

机构：

来源：

APPLIED OPTICS | 1984年 / 23卷 / 21期

关键词：

D O I：

10.1364/AO.23.003796

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3796 / 3805

页数：10

共 41 条

[1] LASER-INDUCED SURFACE ABLATION AS A PROBE OF OPTICAL-SURFACE DAMAGE MECHANISMS
CHASE, LL
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 46 (1-4): : 252 - 255
[2] ANGULAR-DEPENDENCE OF THE OPTICAL-SURFACE DAMAGE THRESHOLD FOR TRANSPARENT DIELECTRICS
GOLUBTSOV, AA
PILIPETSKII, NF
SUDARKIN, AN
CHUDINOV, AN
SHKUROV, VV
DOKLADY AKADEMII NAUK SSSR, 1985, 282 (04): : 861 - 865
[3] MECHANISMS OF LASER-SURFACE INTERACTIONS, OPTICAL-SURFACE DAMAGE, AND THE INITIATION STAGE OF SURFACE ABLATION
CHASE, LL
HAMZA, AV
LEE, HWH
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1992, 203 : 120 - ANYL
[4] OPTICAL-SURFACE INSPECTION USING A TRANSVERSE SPECKLE DETECTION TECHNIQUE
OULAMARA, A
SPAJER, M
TRIBILLON, G
DUVERNOY, J
OPTICS COMMUNICATIONS, 1988, 67 (01) : 34 - 38
[5] NONEFFECT OF ELECTRONEGATIVE GASES ON PULSED LASER-INDUCED OPTICAL-SURFACE DAMAGE THRESHOLDS
KARDACH, JA
STEWART, AF
GUENTHER, AH
APPLIED OPTICS, 1984, 23 (21): : 3817 - 3819
[6] SPACE TELESCOPE PERFORMANCE PREDICTION USING THE OPTICAL-SURFACE ANALYSIS CODE (OSAC)
GLENN, P
OPTICAL ENGINEERING, 1986, 25 (09) : 1026 - 1033
[7] DETERMINATION OF OPTICAL-SURFACE ROUGHNESS PARAMETERS USING SCATTERING IN A DIELECTRIC WAVE-GUIDE
ANDLER, G
EGOROV, AA
CHEREMISKIN, IV
OPTIKA I SPEKTROSKOPIYA, 1984, 56 (04): : 731 - 735
[8] ONSET THRESHOLD ANALYSIS OF DEFECT-DRIVEN SURFACE AND BULK LASER DAMAGE
OCONNELL, RM
APPLIED OPTICS, 1992, 31 (21): : 4143 - 4153
[9] 1ST RESULTS OF THE 2-COORDINATE TREATMENT OF OPTICAL-SURFACE USING A COMPUTER
VITRICHENKO, EA
GORELIK, VV
EVSEEV, OA
IRTUGANOV, SS
MALYKHIN, VA
NEKRASOV, VV
PROKHOROV, AM
REBROV, AV
SAVELIEV, AV
TRUSHIN, EV
DOKLADY AKADEMII NAUK SSSR, 1982, 265 (02): : 328 - 330
[10] OPTICAL-SURFACE INSPECTION USING REAL-TIME FOURIER-TRANSFORM HOLOGRAPHY IN PHOTOREFRACTIVES
UHRICH, C
HESSELINK, L
APPLIED OPTICS, 1988, 27 (21): : 4497 - 4503

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