ON THE PRESENCE OF HOLES IN STEARIC-ACID LANGMUIR-BLODGETT-FILMS STUDIED BY DARK FIELD ELECTRON-MICROSCOPY

被引：14
|
作者：
LUK, SY
WRIGHT, AC
WILLIAMS, JO
机构：
[1] Solid State Chemistry Group, Chemistry Department, University of Manchester Institute of Science and Technology, Manchester, M60 1QD
来源：
THIN SOLID FILMS | 1990年 / 186卷 / 01期
关键词：
D O I：
10.1016/0040-6090(90)90508-B
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Transmission electron microscopy using the dark field mode of imaging has been demonstrated as a useful method for the structural characterization of Langmuir-Blodgett (LB) thin films and for revealing the presence of holes in such films. In this paper, we show that the presence of such holes may be related to the nature of the substrate used to support the LB films and that some substrates, notably amorphous carbon, may be unsuitable for this purpose. In addition, real-time electron microscopy studies reveal that holes may, in some materials at least, be created by the action of the electron beam. © 1990.
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页码：147 / 154
页数：8
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