NOISE-PARAMETER MEASUREMENTS OF MICROWAVE TRANSISTORS UP TO 2 4GHZ

被引：2

|

作者：

BACHTOLD, W

STRUTT, MJO

机构：

来源：

ELECTRONICS LETTERS | 1967年 / 3卷 / 07期

关键词：

D O I：

10.1049/el:19670247

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：323 / &

相关论文

共 50 条

[21] FET noise-parameter determination using a novel technique based on 50-Ω noise-figure measurements
Lázaro, A
Pradell, L
O'Callaghan, JM
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1999, 47 (03) : 315 - 324
[22] Cryogenic noise parameter measurements of microwave devices
Rolfes, I
Musch, T
Schiek, B
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (02) : 373 - 376
[23] ACCURACY IMPROVEMENTS IN MICROWAVE NOISE PARAMETER MEASUREMENTS
DAVIDSON, AC
LEAKE, BW
STRID, E
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1989, 37 (12) : 1973 - 1978
[24] Cryogenic noise parameter measurements of microwave devices
Rolfes, I
Musch, T
Schiek, B
2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, 2000, : 453 - 454
[25] A 90nm quadrature generator with frequency extension up to 4GHz
Stengel, Bob
Rami, Said
2007 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-11, 2007, : 1697 - +
[26] FULLY SOLID-STATE 4GHZ MICROWAVE RADIO-RELAY SYSTEM
TAKITA, S
AOKI, S
JAPAN TELECOMMUNICATIONS REVIEW, 1970, 12 (01): : 34 - &
[27] Improved Y-factor method for wide-band on-wafer noise-parameter measurements
Tiemeijer, LF
Havens, RJ
de Kort, R
Scholten, AJ
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2005, 53 (09) : 2917 - 2925
[28] IMPOSSIBILITY OF LINEAR 2-PORT NOISE-PARAMETER MEASUREMENT WITH A SINGLE TEMPERATURE NOISE SOURCE
GUPTA, MS
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1983, 32 (03) : 443 - 445
[29] Comments on "Cryogenic noise parameter measurements of microwave devices"
Wiatr, W
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2004, 53 (02) : 619 - 619
[30] ACCURACY IMPROVEMENTS IN MICROWAVE NOISE PARAMETER MEASUREMENTS - COMMENT
UHLIR, A
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (01) : 157 - 157

← 1 2 3 4 5 →