NOISE-PARAMETER MEASUREMENTS OF MICROWAVE TRANSISTORS UP TO 2 4GHZ

被引：2
|
作者：
BACHTOLD, W
STRUTT, MJO
机构：
来源：
ELECTRONICS LETTERS | 1967年 / 3卷 / 07期
关键词：
D O I：
10.1049/el:19670247
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：323 / &
相关论文
共 50 条
  • [1] Verification of Noise-Parameter Measurements and Uncertainties
    Randa, James
    Dunsmore, Joel
    Gu, Dazhen
    Wong, Ken
    Walker, David K.
    Pollard, Roger D.
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2011, 60 (11) : 3685 - 3693
  • [2] Uncertainty analysis for noise-parameter measurements
    Randa, James
    2008 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, 2008, : 498 - 499
  • [3] SILICON MICROWAVE TRANSISTOR WITH 2DB NOISE-FIGURE AT 4GHZ
    MATSUMOTO, M
    ISHII, K
    ITOH, M
    FUJITSU SCIENTIFIC & TECHNICAL JOURNAL, 1977, 13 (04): : 53 - 67
  • [4] Automated Noise-Parameter Measurements of Cryogenic LNAs
    Sheldon, Alexander
    Belostotski, Leonid
    Mani, Hamdi
    Groppi, Christopher E.
    Warnick, Karl F.
    97TH ARFTG MICROWAVE MEASUREMENT CONFERENCE: CONDUCTED AND OTA MEASUREMENT CHALLENGES FOR URBAN, RURAL & SATCOMM CONNECTIVITY, 2021,
  • [5] SIMULATOR FOR AMPLIFIER AND TRANSISTOR NOISE-PARAMETER MEASUREMENTS
    Randa, James
    2010 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS CPEM, 2010, : 555 - 556
  • [6] Uncertainty Analysis for Noise-Parameter Measurements at NIST
    Randa, James
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2009, 58 (04) : 1146 - 1151
  • [7] SCATTERING AND NOISE PARAMETERS OF 4 RECENT MICROWAVE BIPOLAR TRANSISTORS UP TO 12 GHZ
    HARTMANN, K
    STRUTT, MJO
    PROCEEDINGS OF THE IEEE, 1973, 61 (01) : 133 - 135
  • [8] Novel MMIC source-impedance tuners for on-wafer microwave noise-parameter measurements
    McIntosh, CE
    Pollard, RD
    Miles, RE
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1999, 47 (02) : 125 - 131
  • [9] NOISE-PARAMETER MEASUREMENTS WITH A REFLECTION TYPE PHASE SHIFTER
    Gu, Dazhen
    Walter, David K.
    Randa, James
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2010, 52 (11) : 2600 - 2603
  • [10] NOISE MEASUREMENTS OF SILICON PLANAR MICROWAVE TRANSISTORS IN FREQUENCY RANGE 4-8 GHZ
    KOTYCZKA, W
    STRUTT, MJO
    ELECTRONICS LETTERS, 1970, 6 (15) : 478 - &
12345