LOCALIZATION OF FAULTS IN DIGITAL CIRCUITS

被引：0
|
作者：
GROBMAN, DM
机构：
来源：
AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA | 1983年 / 02期
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
引用
收藏
页码：79 / 84
页数：6
相关论文
共 50 条
  • [21] Test method for crosstalk-induced delay faults in digital circuits
    Pan Zhongliang
    Chen Ling
    ISTM/2007: 7TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-7, CONFERENCE PROCEEDINGS, 2007, : 434 - 437
  • [22] MODELING OF DIGITAL CIRCUITS FUNCTION AND FUNCTIONAL FAULTS ON REGISTER TRANSFER LEVEL
    GAWIN, J
    MICROPROCESSING AND MICROPROGRAMMING, 1992, 35 (1-5): : 167 - 172
  • [23] On the modelling of digital circuits for the test pattern generation for device input faults
    Dokouzyannis, Stavros P.
    Microelectronics Reliability, 1994, 34 (12) : 1923 - 1929
  • [24] Test method based on neural network for crosstalk faults in digital circuits
    Pan Zhongliang
    Chen Ling
    Zhang Guangzhao
    FIFTH INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY, 2009, 7133
  • [25] Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits
    Milano, Nicola
    Nolfi, Stefano
    PLOS ONE, 2016, 11 (07):
  • [26] A multiple faults test approach for digital circuits using neural networks
    Pan, ZL
    Chen, L
    Chen, GJ
    2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, 2002, : 871 - 874
  • [27] Using a pulsed supply voltage for delay faults testing of digital circuits in a digital oscillation environment
    Vermaak, HJ
    Kerkhoff, HG
    Jordaan, GD
    2002 IEEE AFRICON, VOLS 1 AND 2: ELECTROTECHNOLOGICAL SERVICES FOR AFRICA, 2002, : 47 - 52
  • [28] Fault Collapsing For Digital Circuits Based On Relations Between Stuck-At Faults
    Grigoryan, Tigranuhi
    Malkhasyan, Heghineh
    Mushyan, Gevorg
    Vardanian, Valery
    TENTH INTERNATIONAL CONFERENCE ON COMPUTER SCIENCE AND INFORMATION TECHNOLOGIES REVISED SELECTED PAPERS CSIT-2015, 2015, : 15 - 18
  • [29] Using Model Checker to Analyze and Test Digital Circuits with Regard to Delay Faults
    Strnadel, Josef
    2021 24TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS), 2021, : 111 - 114
  • [30] Fault Detection of Bridging Faults in Digital Circuits by Shared Binary Decision Diagram
    Chen Ling
    Pan Zhongliang
    ADVANCED MEASUREMENT AND TEST, PARTS 1 AND 2, 2010, 439-440 : 1235 - 1240
12345