METHOD FOR COMPLEX-X-RAY DIFFRACTION ANALYSIS OF TIN COATINGS

[1] ALLAN CG, 1974, UKAEA TRG2548 REP

[2] DETERMINATION OF MOLAR RATIO IN AB1-X ROCK-SALT-TYPE COMPOUNDS BY X-RAY-POWDER DIFFRACTION METHOD - APPLICATION TO TIC1-X [J]. CRYSTAL RESEARCH AND TECHNOLOGY, 1986, 21 (06) : 735 - 740

[3] DETERMINATION OF TWIN FAULT PROBABILITIES FROM DIFFRACTION PATTERNS OF FCC METALS AND ALLOYS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (06) : 2073 - &

[4] USE OF THE VOIGT FUNCTION IN A SINGLE-LINE METHOD FOR THE ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (JUN) : 308 - 314

[5] DETERMINATION OF CRYSTALLITE SIZE AND LATTICE-DISTORTIONS THROUGH X-RAY-DIFFRACTION LINE-PROFILE ANALYSIS - RECIPES, METHODS AND COMMENTS [J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1982, 312 (01): : 1 - 16

[6] DELHEZ R, 1980, NBS PUBLICATION

[7] THE DETERMINATION OF LATTICE-PARAMETERS AND STRAINS IN STRESSED THIN-FILMS USING X-RAY-DIFFRACTION WITH SEEMANN-BOHLIN FOCUSING [J]. THIN SOLID FILMS, 1985, 124 (3-4) : 283 - 291

[8] HUANG TC, 1979, ADV XRAY ANAL, V22, P43

[9] JAMES MR, 1980, TREATISE MATERIALS A, V19, P1

[10] Klug H. P., 1970, XRAY DIFFRACTION PRO

[1] ALLAN CG, 1974, UKAEA TRG2548 REP

[2] DETERMINATION OF MOLAR RATIO IN AB1-X ROCK-SALT-TYPE COMPOUNDS BY X-RAY-POWDER DIFFRACTION METHOD - APPLICATION TO TIC1-X [J]. CRYSTAL RESEARCH AND TECHNOLOGY, 1986, 21 (06) : 735 - 740

[3] DETERMINATION OF TWIN FAULT PROBABILITIES FROM DIFFRACTION PATTERNS OF FCC METALS AND ALLOYS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (06) : 2073 - &

[4] USE OF THE VOIGT FUNCTION IN A SINGLE-LINE METHOD FOR THE ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (JUN) : 308 - 314

[5] DETERMINATION OF CRYSTALLITE SIZE AND LATTICE-DISTORTIONS THROUGH X-RAY-DIFFRACTION LINE-PROFILE ANALYSIS - RECIPES, METHODS AND COMMENTS [J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1982, 312 (01): : 1 - 16

[6] DELHEZ R, 1980, NBS PUBLICATION

[7] THE DETERMINATION OF LATTICE-PARAMETERS AND STRAINS IN STRESSED THIN-FILMS USING X-RAY-DIFFRACTION WITH SEEMANN-BOHLIN FOCUSING [J]. THIN SOLID FILMS, 1985, 124 (3-4) : 283 - 291

[8] HUANG TC, 1979, ADV XRAY ANAL, V22, P43

[9] JAMES MR, 1980, TREATISE MATERIALS A, V19, P1

[10] Klug H. P., 1970, XRAY DIFFRACTION PRO