SHEAR STRAIN MAPPING FROM MOIRE INTERFEROMETRY

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作者：

PATORSKI, K

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来源：

OPTICA APPLICATA | 1987年 / 17卷 / 04期

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中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

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页码：307 / 312

页数：6

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