SHEAR STRAIN MAPPING FROM MOIRE INTERFEROMETRY

被引：0
|
作者：
PATORSKI, K
机构：
来源：
OPTICA APPLICATA | 1987年 / 17卷 / 04期
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D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
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页码：307 / 312
页数：6
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