REFINEMENT OF TIME-RESOLVED X-RAY-MEASUREMENT SYSTEM FOR STUDYING THE LATTICE DEFORMATION OF SILICON UNDER PULSED ND-YAG LASER IRRADIATION

被引：5
作者：
KOJIMA, S
MAEKAWA, I
KAWADO, S
TAKAHASHI, T
ISHIKAWA, T
KIKUTA, S
机构：
[1] UNIV TOKYO,INST SOLID STATE PHYS,MINATO KU,TOKYO 106,JAPAN
[2] UNIV TOKYO,FAC ENGN,BUNKYO KU,TOKYO 113,JAPAN
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 01期
关键词：
D O I：
10.1063/1.1143123
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The time-resolved x-ray measurement system using the TAC technique and the MCS technique has been improved after the previous SRI conference. The improved TAC technique enables us to measure a time-resolved x-ray diffraction intensity distribution across a laser spot at any time after laser flashing with a time resolution of 25 ns under the multibunch operation of synchrotron radiation sources. Optical fiber delay units are developed for the MCS technique instead of ECL delay units to obtain long delay time for detective signals.
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页码：1164 / 1167
页数：4
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